PXIe-4132是一款可编程、高精度的源测量单元(SMU),它具有一个单独隔离的SMU通道,提供四象限±100 V输出。该通道的源极功率和漏极功率均高达2 W,能够以源级输出和漏极输出的方式在100 V电压下提供高达20 mA的电流驱动,在40 V电压下提供高达50 mA的电流驱动,在20 V电压下提供高达100 mA的电流驱动。结合其高测量分辨率集成防护,PXIe-4132非常适用于集成电路、分立元件、PCB和电缆的高精度漏电测量。您还可以使用板载硬件序列生成引擎对各种组件(包括二极管和有机LED)进行高速I-V测量。
PXIe-4132的应用场景包括但不限于以下几个方面:
集成电路测试:用于测试集成电路的漏电特性,以验证其性能和可靠性。
电子元件测试:测试各种电子元件的电源特性和性能,如二极管、有机LED等。
电源管理测试:测试电源管理单元的特性,以确保电源系统的可靠性和稳定性。
传感器测试:用于测试各种传感器的电源特性和性能,如温度传感器、压力传感器等。
电池测试:PXIe-4132可以用于测试电池的充电和放电特性,以评估电池的性能和寿命。

PXIe-4132
The PXIe-4132 is a programmable, high-precision source measurement unit (SMU) with a single isolated SMU channel providing a four-quadrant ±100 V output. With both source and drain power up to 2 W, the channel is capable of providing up to 20 mA of current drive at 100 V, up to 50 mA at 40 V and up to 100 mA at 20 V in the form of both source and drain outputs. Combined with its high measurement resolution integrated protection, the PXIe-4132 is ideal for high-precision leakage measurement of integrated circuits, discrete components, PCBS and cables. You can also use the onboard hardware sequence generation engine for high-speed I-V measurements of various components, including diodes and organic leds.
The application scenarios of PXIe-4132 include but are not limited to the following aspects:
Integrated circuit testing: Used to test the leakage characteristics of integrated circuits to verify their performance and reliability.
Electronic component testing: Test the power characteristics and performance of various electronic components, such as diodes, organic leds, etc.
Power Management test: Test the characteristics of the power management unit to ensure the reliability and stability of the power system.
Sensor testing: Used to test the power characteristics and performance of various sensors, such as temperature sensors, pressure sensors, etc.
Battery testing: The PXIe-4132 can be used to test the charging and discharging characteristics of the battery to evaluate the performance and life of the battery.
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